16.05.2024
09:15Uhr (MEZ)
inVISION Day Metrology
Moderation:
Dr.-Ing. Peter Ebert
inVISION Day Metrology
At the inVISION Day Metrology current applications and new technologies will be presented at the four sessions 3D Scanner, Inline Metrology, Surface Metrology, CT & X-Ray. The free online conference will be completed by a keynote speech, a panel discussion and the EMVA Pitches, where four start-up companies will present their innovations.
Moderation:
Dr.-Ing. Peter Ebert
Themen:
-
Session 1: 3D Scanner
AT Automation Technology, Hexagon, Saccade Vision
-
Session 2: Inline Metrology
Nikon, Micro-Epsilon, Eleven Dynamics, Automated Precision Europe
-
Session 3: Surface Metrology
Opto, Heliotis, Mahr, Precitec/Enovasense
-
Session 4: CT & X-ray
Fraunhofer EZRT / X-ray Lab